- 16 head test system with large test area of 24" x 39.4"
The system combines outstanding test speed and high accuracy. It is our best seller for Probe Cards and Backpanel applications.
The system combines outstanding test speed and high accuracy. It is our best seller for Probe Cards and Backpanel applications.
16 test heads |
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Linear motor drives for X- and Z-axis |
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Stepper motor technology for phi-axis |
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Max. test area |
610 mm x 1000 mm (24" x 39.4") |
Max. product size |
610 mm x 1050 mm (24" x 41.4") |
Test speed |
up to 260 TP/sec (depending on test method) |
4 high-resolution color XGA-cameras |
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Smallest pad size |
50 µm (2 mil) |
Smallest pitch |
100 µm (4 mil) |
Micro short detection (MSD®) |
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Pneumatic clamping / tension frame
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Options |
Embedded component test, Test floor integration with Universal Grid systems, High Speed Kelvin 4 wire test up to 300 mA*, LaTest® (Latent defect) and BackDrill testing |
With more than 40 years in the electronics industry and a unique market-leading position, you can count on us. We understand the fast changes in the market and have a strong local presence in over 50 countries to help our customers. We deliver technologies that are future-proof and are devoted to our mission and our clients.