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  • Productivity 4 ultra-light carbon test heads with air bearings
  • Stability Granit base frame for highest accuracy
  • Flexibility Supports high-end substrate applications


The S3 is able to test 10 µm structures while achieving 100 measurements per second. The machine, therefore, provides the customer with an economical test solution for high-end substrates.

The S3 has a granite frame, which provides the best temperature stability. The high-resolution cameras of 1.2  µm per pixel allow automatic scanning and testing of 10 µm.

Key benefits

  • Catering to the needs of substrate testing

The system combines accuracy and low witness marks with high throughput. The vacuum table allows easy handling of substrate and facilitates capacitance based testing.


4 test heads


Ceramic air bearings for ultra-precise and sensitive contacting  


Max. test area mode 

300 mm x 310 mm (11.8"x 12.2")

Max. product size 

330 mm x 310 mm (13.0" x 12.2")

Vacuum table for reference-based test


Test speed

up to 120 TP/sec (depending on test method)

Smallest pad size

10 µm (0.4 mil)

Smallest pitch size

25 µm (1.0 mil)

5-megapixel high-solution camera with 1.2 µm/px


No visible witness marks without sacrificing test speed




High-speed Kelvin 4 wire test up to 300 mA, Embedded component test SECS/GEM integration on demand


Customized automation setup on request






Superior service for superior performance

Our service offering for our advanced Bare board testing is a key part of our commitment to our customers. Our objectives are to maximize throughput, performance and yield for the lifetime of every system installed.

Best partner

You can count on us

With more than 40 years in the electronics industry and a unique market-leading position, you can count on us. We understand the fast changes in the market and have a strong local presence in over 50 countries to help our customers. We deliver technologies that are future-proof and are devoted to our mission and our clients.